辛  光， 伍川辉
（西南交通大学机械工程学院，四川 成都 610031）
摘  要：为满足高速动车组车内噪声试验的需求，设计一种基于DSP的噪声测试系统，对测试系统的设计方案以及软硬件实现进行介绍。系统由控制部分和运算部分组成：控制部分以高性能、低功耗的基于ARM Cortex-M3内核的微控制器STM32F103ZET6为核心，扩展了A/D采集模块、NAND Flash存储模块以及蓝牙通信模块；运算部分以TI公司的低功耗DSP芯片TMS320VC5509A作为核心，负责对采集的噪声数据进行实时处理，并把结果交给ARM发送给上位机，以实现对试验效果的实时观察；ARM与DSP通过双端口RAM相连接，使得两种处理器间的频率差异得到解决并能有效地实现数据交换。实验证明：基于DSP的噪声测试系统能很好地满足高速动车组车内噪声试验对噪声数据采集和实时处理的需求。
关键词：测试系统；DSP；ARM Cortex-M3内核；高速动车组；车内噪声；双口RAM
中图分类号：TP216+.2；U292.91+4；TB535；TP274+.2    文献标志码：A     文章编号：1674-5124（2013）03-0084-04
High-speed EMUs interior noise test system based on DSP
XIN Guang， WU Chuan-hui
（School of Mechanical Engineering，Southwest Jiaotong University，Chengdu 610031，China）
Abstract: In order to meet the demand of interior noise tests for high-speed EMUs， a DSP-based noise test system was designed. The system consists of the control part and the computation section. High-performance and low power consumption control part takes ARM Cortex-M3 core-based microcontrollers STM32F103ZET6 as the core and extends A/D acquisition module， NAND Flash memory module， and Bluetooth communication module. Computing part takes TI’s low-power DSP chips TMS320VC5509A as the core and it is responsible for collecting the noise data in real-time processing， and sending the results to the host computer through the ARM in order to achieve real-time observation of the test results. ARM and DSP were connected with the dual-port RAM， which made the frequency differences between two processors resolved with effective data exchange. Experimental results show that the noise test system based on DSP can meet the demands of noise data acquisition and real-time processing for high-speed EMUs interior noise test.
Key words: test system； DSP； ARM Cortex-M3 corebased； high-speed EMUs； vehicle interior noise； dual-port RAM